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Analysis of Conducting and Insulating Surfaces by Means of Secondary Ion Mass Spectrometry (SIMS)
Analysis of Conducting and Insulating Surfaces by Means of Secondary Ion Mass Spectrometry (SIMS)
1975
M. De Paz
C. Macciò
Keywords:
Thermal ionization mass spectrometry
Nuclear magnetic resonance
Secondary ion mass spectrometry
Analytical chemistry
Static secondary-ion mass spectrometry
Mass spectrometry
Chemistry
Inorganic chemistry
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