Investigations of microstructural changes and spectral characteristics of tantala stabilized zirconia refractories

Abstract Several samples of zirconia doped tantala have been prepared and well sintered. Measurements of X-ray diffraction, infrared absorption spectra and bulk density were carried out before and after an absorbed energetic gamma radiation dose (5·26 × 10 6 rd.). Results obtained were consistent and explained on the basis of the interactions of tantala dopant (at high temperature) and energetic gamma radiation with zirconia and stabilized zirconia lattices.