Noise suppression and data interpolation with 3D CRS-OIS

Summary The CRS-OIS is a common reflection surface (CRS) stack method with an output imaging scheme. Differed from conventional 3D CRS stack, 3D CRS-OIS operator is a double-smearing operator based on 3D local coherent events searched in common-offset section. The so-called double-smearing means, for any a Ph in CO section, firstly smearing Ph along its 3D local coherent events in 3D CO volume; secondly, for each sample being smeared out from Ph, smearing it again along its own 3D NMO/DMO responses. The outplanat in the first step is a 3D local coherent events searched in CO section and the outplanat in the second step is their 3D NMO/DMO responses. If we just perform the first step of 3D CRS-OIS, a superior 3D pre-stack dataset with a higher signal/noise (S/N) ratio and a better regularity can be generated as a by-product of 3D CRS-OIS. The synthetic and real data example demonstrates that 3D CRS-OIS can b eu sed as a robust tool for noise suppression and data interpolation.