Submicron-Scale Tip Fabrication for Magnetic Force Microscopy by Electrolytic Polishing

An electrolytic polishing technique which exposes a portion of an insulated wire and etches that portion preferentially is described. The prepared tip's configuration immediately prior to dropping off depends on the tip's weight and mechanical properties. The tip-point curvature can be below-submicron scale. Magnetic force imaging of recorded magnetic tape using these tips is shown.