A flexible and robust soft-error testing system for microelectronic devices and integrated circuits

Single event effects(SEEs) induced by radiations become a significant challenge to the reliability for modern electronic systems. To evaluate SEEs susceptibility for microelectronic devices and integrated circuits(ICs), an SEE testing system with flexibility and robustness was developed at Heavy Ion Research Facility in Lanzhou(HIRFL). The system is compatible with various types of microelectronic devices and ICs, and supports plenty of complex and high-speed test schemes and plans for the irradiated devices under test(DUTs). Thanks to the combination of meticulous circuit design and the hardened logic design, the system has additional performances to avoid an overheated situation and irradiations by stray radiations. The system has been tested and verified by experiments for irradiating devices at HIRFL.