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DEPTH PROFILES OF IMPLANTED F-18, BR-79, AND XE-132 IN SILICON IN THE ENERGY-RANGE 85-600 KEV
DEPTH PROFILES OF IMPLANTED F-18, BR-79, AND XE-132 IN SILICON IN THE ENERGY-RANGE 85-600 KEV
1989
Cy Tan
Yy Xia
Hong-Jie Yang
Xf Sun
Liu
Zs Zheng
P. Zhu
Keywords:
Radiochemistry
Silicon
Chemistry
Materials science
Analytical chemistry
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