Molecular effects in KLn multiple ionization of Al for H+ and H2+ ion impacts

Abstract Aluminum K α X-ray spectra for equal velocity H + and H 2 + ions of 0.8–1.5 MeV/amu incident on thin aluminum and aluminum oxide films with the thicknesses 100–500 A were observed. The high resolution X-ray spectra were observed with a Bragg crystal spectrometer. From the K α satellite intensity the L-shell ionization probability was investigated. The L-shell ionization probability for H 2 + incident on Al films of thickness 100 A was about 8% larger than that for H + incident. For Al films of thickness 300 and 500 A the enhancements were about 5%. Similar results were obtained for aluminum oxide films.