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Scanning Electron Acoustic Microscopy: A Novel Tool for Failure Analysis and Microcharacterization
Scanning Electron Acoustic Microscopy: A Novel Tool for Failure Analysis and Microcharacterization
2000
W.K. Wong
J T L Thong
J.C.H. Phang
Q. R. Yin
J. W. Fang
Keywords:
Optics
Acoustic microscopy
Scanning electron microscope
Materials science
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