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Series resistance degradation due to NBTI in PMOSFET
Series resistance degradation due to NBTI in PMOSFET
2002
Mahesh S. Krishnan
Viktor Kol’dyaev
Eiji Morifoji
Koji Miyamoto
Tomasz Brozek
Xiaolei Li
Keywords:
Equivalent series resistance
Reliability engineering
Electronic engineering
Engineering
Degradation (geology)
Correction
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