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Probing Crystalline Defects Using an EBSD-Based Virtual Dark-Field Method
Probing Crystalline Defects Using an EBSD-Based Virtual Dark-Field Method
2019
Shiteng Zhao
Ruopeng Zhang
Thomas C. Pekin
Andrew M. Minor
Keywords:
Metallurgy
Engineering physics
Dark field microscopy
Materials science
Electron backscatter diffraction
Crystal
Correction
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