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Cryogenic Characterization of Low-frequency Noise Based on Cryo-CMOS: Impact of Interface Trap Density
Cryogenic Characterization of Low-frequency Noise Based on Cryo-CMOS: Impact of Interface Trap Density
2021
Hiroshi Oka
Takashi Matsukawa
Kimihiko Kato
Shota Iizuka
Wataru Mizubayashi
Kazuhiko Endo
Tetsuji Yasuda
Takahiro Mori
Keywords:
Optoelectronics
CMOS
characterization
Interface (computing)
Materials science
trap density
Infrasound
Correction
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