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Thermal scanning probe lithography of topological regions in disordered Sb 2 Te 3 thin films
Thermal scanning probe lithography of topological regions in disordered Sb 2 Te 3 thin films
2018
Shihua Zhao
Inna Korzhovska
Edoardo Albisetti
Elisa Riedo
Lia Krusin-Elbaum
Keywords:
Thin film
Thermal scanning probe lithography
Materials science
Optoelectronics
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