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Coupled Approach for Reliability Study of Fully Self Aligned SiGe:C 250GHz HBTs
Coupled Approach for Reliability Study of Fully Self Aligned SiGe:C 250GHz HBTs
2008
Diop
Revil
Monsieur
Schwartzmann
Ghibaudo
Keywords:
Temperature measurement
reliability study
Reliability engineering
Stress (mechanics)
Reliability (statistics)
Silicon carbide
Probability density function
Materials science
degradation
Correction
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