EIS comparative study and critical Equivalent Electrical Circuit (EEC) analysis of the native oxide layer of additive manufactured and wrought 316 L stainless steel

Abstract In this work, a comparative electrochemical impedance spectroscopy (EIS) study of the native oxide layer of selective laser melted and wrought 316 L stainless steel is conducted. A careful examination of the data is carried out in order to properly identify the appropriate model to fit the EIS response. From the parameters calculated by fitting the EIS data and a complementary XPS analysis, the electrical and dielectric characteristics of the passive oxide layers of the specimens were obtained. Clear differences were noticed between the two materials, which could definitely contribute to the overall understanding of the corrosion behavior of these materials.