Old Web
English
Sign In
Acemap
>
Paper
>
Aging test of AlGaN-based ultraviolet light emitting diodes -- The Degradation Mechanism of UV-LED
Aging test of AlGaN-based ultraviolet light emitting diodes -- The Degradation Mechanism of UV-LED
2011
Park,Gwi,Jin
Sugiyama Takayuki
Tanikawa Tomoyuki
Honda Yoshio
Yamaguchi Masahito
Amano Hiroshi
Inazu Tetsuhiko
Fujita Takehiko
Pernot Cyril
Hirano Akira
Keywords:
Light-emitting diode
Ultraviolet
Optoelectronics
Materials science
aging test
Degradation (geology)
ultraviolet light emitting diodes
Correction
Source
Cite
Save
Machine Reading By IdeaReader
0
References
0
Citations
NaN
KQI
[]