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The thickness and temperature dependent resistivity of thin copper films
The thickness and temperature dependent resistivity of thin copper films
2003
Wenqi Zhang
Sywert Brongersma
Trudo Clarysse
Wen Wu
Iwan Vervoort
Roger Palmans
Ilse Hoflijk
Hugo Bender
W. Hui
Laure Carbonell
Erik Rosseel
Wilfried Vandervorst
Karen Maex
Keywords:
Copper
Electrical resistivity and conductivity
Materials science
Metallurgy
Composite material
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