Monitoring of defects creation sequence in 808 nm laser diode by reflectance analysis

Abstract Changes in both surface morphology and transient reflectance on the front facet of a diode laser are monitored during a catastrophic optical damage (COD) process in a single pulse operation. Use of a 1550 nm time-resolved micro-reflectance optical system (with time resolution of ~4 ns) allows us to monitor the creation sequences of up to four distinct COD seed points on an 808 nm laser facet within a period of