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A specific emitter identification method based on full bispectrum and deep residual shrinkage network
A specific emitter identification method based on full bispectrum and deep residual shrinkage network
2021
Zihao Song
Wei Cheng
Jingwen Li
Xiaobai Li
Keywords:
Residual
emitter identification
Materials science
Bispectrum
Acoustics
Shrinkage
Correction
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