Two-dimensional boundary conditions and finite-size effects in angle-resolved photoelectron emission spectroscopy, low-energy electron diffraction, and high-resolution electron-energy-loss spectroscopy
1988
The plane-wave and spherical-wave boundary conditions across a vacuum-solid interface are derived for electron emission and diffraction spectroscopies. The proper boundary condition to be chosen across a realistic interface is determined. We also compare the exact form of inelastic electron damping with those of phenomenological models. We determine the errors in the latter. Finite-size effects in low-energy electron diffraction and high-resolution electron-energy-loss spectroscopy are determined.
Keywords:
- Soft X-ray emission spectroscopy
- Condensed matter physics
- Gas electron diffraction
- Low-energy electron diffraction
- Nuclear magnetic resonance
- Electron backscatter diffraction
- Electron spectroscopy
- High resolution electron energy loss spectroscopy
- Electron diffraction
- Physics
- Reflection high-energy electron diffraction
- Atomic physics
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