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Cluster growth of Al on stepped and unstepped GaAs(110) at 300 K: A scanning-tunneling-microscopy examination.
Cluster growth of Al on stepped and unstepped GaAs(110) at 300 K: A scanning-tunneling-microscopy examination.
1992
J. C. Patrin
Y. Li
J. H. Weaver
Keywords:
Transition metal
Thin film
Agrégation
Monolayer
Scanning tunneling microscope
Aluminium
Nuclear magnetic resonance
Physics
Condensed matter physics
semiconductor materials
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