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Simulation of resonant strip probes for interference near-field microscopy
Simulation of resonant strip probes for interference near-field microscopy
2019
V. P. Belichenko
A. S. Mironchev
A. V. Klokov
A S Zapasnoy
Keywords:
Interference (wave propagation)
Optics
Near-field scanning optical microscope
Materials science
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