Effects of Annealing and Light on Co-evaporated Methylammonium Lead Iodide Perovskites using Kelvin Probe Force Microscopy in Ultra-High Vacuum

Careful surface analysis is essential to understand the electronic and ionic behaviors in perovskite absorbers. In this contribution we discuss Kelvin probe force microscopy performed in ultra-high vacuum on as-grown and annealed co-evaporated methylammonium lead iodide perovskite thin films. By comparing the contact potential difference upon annealing and illumination, we find that annealing increases the average workfunction, indicating a change either in doping or in surface composition. Illumination also increases the average workfunction, indicating a p-type absorber, by reducing band bending as the photo-generated carriers screen the surface states. The effect of light shows a two-step process, with a first fast trend, linked to the surface photovoltage and a second slower trend indicating a possible redistribution of mobile charges.