How we test Siemens Embedded DRAM Cores
1998
The techniques used to test Siemens Embedded DRAM Cores are described. Test Isolation and Design-For-Test logic is built in to the core interface, while external access and Algorithmic Pattern Generation are handled by a central Test Controller. All tests used for standard DRAM's can be applied to the DRAM cores, but only a subset of these are used for any given product.
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