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An on-die digital aging monitor against HCI and xBTI in 16 nm Fin-FET bulk CMOS technology
An on-die digital aging monitor against HCI and xBTI in 16 nm Fin-FET bulk CMOS technology
2015
Mitsuhiko Igarashi
Kan Takeuchi
Takeshi Okagaki
Koji Shibutani
Hiroaki Matsushita
Koji Nii
Keywords:
Electronic engineering
Fin
Electrical engineering
CMOS
Engineering
Computer science
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