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OS4(P)-6(OS04W0020) Ferroelectric Domain Observation by X-Ray Diffraction Topography
OS4(P)-6(OS04W0020) Ferroelectric Domain Observation by X-Ray Diffraction Topography
2003
Yasuhiro Yoneda
yoshiki kohmura
Yoshio Suzuki
Shinichi Hamazaki
Masaaki Takashige
Keywords:
X-ray crystallography
Crystallography
Single crystal
Ferroelectricity
Materials science
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