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INFORMATION DEPTH OF THE BACKREFLECTED ELECTRON MODE IN SCANNING ELECTRON MICROSCOPY
INFORMATION DEPTH OF THE BACKREFLECTED ELECTRON MODE IN SCANNING ELECTRON MICROSCOPY
1998
A. V. Gostev
A. N. Matvienko
E. I. Rau
V. O. Savin
D. O. Savin
Keywords:
Physics
Nuclear magnetic resonance
Scanning confocal electron microscopy
Scanning electron microscope
Energy filtered transmission electron microscopy
Electron beam-induced deposition
Electron
Scanning transmission electron microscopy
Electron tomography
Optoelectronics
Atomic physics
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