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F116 ガスジェット浮遊法とX線散乱を用いた液体Bi-Ga合金の構造解析
F116 ガスジェット浮遊法とX線散乱を用いた液体Bi-Ga合金の構造解析
2014
hikari ta kitamura
masahiko masaki
takehiko isikawa
akitosi mizuno
sinzi kohara
Keywords:
Crystallography
Phase (matter)
X-ray crystallography
Chemistry
Analytical chemistry
Materials science
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