Structural, Optical and Dielectric Studies of Zn0.975Mg0.025O Oxide Material

Zn0.975Mg0.025O oxide material synthesized by solid state reaction method. The sample has been characterized for structural studies using reliable technique known as X-ray diffraction characterization. For optical band gap estimation, the diffuse reflectance UV-Vis spectra was collected and analyzed. For electrical properties, we carried out frequency dependent dielectric measurement, The XRD data study revealed the sample has acquired hexagonal structure. Optical band gap of the sample was found to be 3.11eV. The dielectric measurement of the sample revealed the sample is a good dielectric material. Alco the electrical measurement witness semiconducting nature of the sample under investigation.