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The influence of high ionizing dose rate on CMOS IC radiation hardness used in da-ta transmission elements
The influence of high ionizing dose rate on CMOS IC radiation hardness used in da-ta transmission elements
2020
Vladislav D. Kalashnikov
Alexey Yu. Egorov
A.V. Sogoyan
A. V. Ulanova
Andrey B. Karakozov
Pavel A. Balamutov
Keywords:
Ionizing radiation
CMOS
Materials science
dose rate
Radiation hardening
Optoelectronics
Correction
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