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Report on the May 2016 ASTM E57.02 instrument runoff at NIST, Part 1 Background information and key findings
Report on the May 2016 ASTM E57.02 instrument runoff at NIST, Part 1 Background information and key findings
2016
Balasubramanian Muralikrishnan
Prem K. Rachakonda
Katharine M. Shilling
Vincent D. Lee
Christopher J. Blackburn
Daniel S. Sawyer
Geraldine S. Cheok
Luc Cournoyer
Keywords:
NIST
Dimensional metrology
Engineering drawing
Surface runoff
Mechanical engineering
Engineering
background information
Systems engineering
Correction
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