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Threshold voltage shift investigation and oxide trap profile extraction in AlGaN/GaN MIS-HEMTs
Threshold voltage shift investigation and oxide trap profile extraction in AlGaN/GaN MIS-HEMTs
2013
Fabio Soci
P. Tedaldi
Ferdinando Iucolano
Alfonso Patti
Gaudenzio Meneghesso
E. Zanoni
Alessandro Chini
Keywords:
Oxide
Threshold voltage
Optoelectronics
algan gan
Materials science
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