Comparison of the Effects of Muon and Low-Energy Proton Irradiation on a 65 nm Low-Power SRAM

Alexandre Bosser,Viyas Gupta,Arto Javanainen,Georgios Tsiligiannis,Helmut Puchner,Frédéric Saigné,Frédéric Wrobel,A. Virtanen,Luigi Dilillo

Comparison of the Effects of Muon and Low-Energy Proton Irradiation on a 65 nm Low-Power SRAM

2016

Alexandre Bosser
Viyas Gupta
Arto Javanainen
Georgios Tsiligiannis
Helmut Puchner
Frédéric Saigné
Frédéric Wrobel
A. Virtanen
Luigi Dilillo

A 65 nm SRAM has been subjected to muon and low-energy proton beams in static and dynamic modes. The experimental results are compared to test simulations.

Keywords:

Muon
Static testing
Irradiation
Physics
Proton
Static random-access memory
Electronic engineering
Dynamic testing
Single event upset
low energy
Beam (structure)
Materials science
Nuclear physics
Particle physics

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