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Ti as an Interface Stabilizer for Fe/Al and Al/Fe Interfaces
Ti as an Interface Stabilizer for Fe/Al and Al/Fe Interfaces
2007
Weerasinghe Priyantha
Andreas Comouth
A. Kayani
Hui Chen
M. Kopczyk
R.J. Smith
David E. McCready
Keywords:
Thin film
Mineralogy
X-ray reflectivity
Materials science
Chemical engineering
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