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Investigation of degradation mechanism and influence of post processes around NiO/ZnO heterointerface
Investigation of degradation mechanism and influence of post processes around NiO/ZnO heterointerface
2019
Naruhide Kato
Kohei Takeuchi
Wang Zehua
Ryo Tanuma
Mutsumi Sugiyama
Keywords:
Materials science
Non-blocking I/O
Chemical engineering
Nickel oxide
Degradation (geology)
mechanism
Correction
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