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Measurement of Micro-Wave Dielectric Properties of SrTiO3 Substrate Thin Plates Using Planar Electrodes
Measurement of Micro-Wave Dielectric Properties of SrTiO3 Substrate Thin Plates Using Planar Electrodes
2004
Takakiyo Harigai
Takashi Teranishi
Song-Min Nam
Hirofumi Kakemoto
Satoshi Wada
Takaaki Tsurumi
Keywords:
Gate dielectric
Dielectric
Dielectric spectroscopy
Substrate (chemistry)
Composite material
Electrode
Materials science
Dielectric loss
planar electrode
Correction
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