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Residual stress measurement in highly textured thin film by in-plane x-ray diffraction
Residual stress measurement in highly textured thin film by in-plane x-ray diffraction
2012
Hsin-Yi Lee
Jia-Hong Huang
Chung-Shing Wu
wuzhangxin
Keywords:
Thin film
X-ray crystallography
Composite material
Ceramic materials
Residual stress
Materials science
in plane
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