Enhanced carrier injection efficiency from lateral current injection in multiple-quantum-well DFB lasers
1996
A bidimensional simulation shows that the lateral carrier injection in etched active region of multiple-quantum-well DFB lasers represents a large fraction of the injected current, leading to improved carrier homogenization in the wells. This increases the average carrier density substantially and provides a much higher gain for the same injected current, depending on detailed device structure.
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