DESIGN, DEVELOPMENT AND CHARACTERIZATION OF SINGLE AND MULTILAYER FILMS

It is well known that in order to get a specific spectral response of a wave after reflection or transmission, thin film multilayer device is unavoidable. Two materials having maximum contrast of refractive index and minimum absorption coefficient are deposited alternatively in pre decided fashion on optically smooth substrate for getting desired spectral response. In visible optics it can be used as high-reflecting mirrors, low/high/band-pass filters, anti reflecting surface, notch filters etc. In x-ray and neutron optics it can be used as mirrors, monochromators, polarizer/analyzer, filters, focusing devices etc. In this communication some of the devices which are in-house designed, developed and characterized are discussed.