Modeling of the behavior of reflected electrons in image converters

Approaches to modeling of the electric field arising at the input of the channels of microchannel plates (MCPs) mounted in image converters (ICs) used in the nigh-vision technique are proposed. A procedure for determining the boundary conditions of the model, which allows one to adequately compute paths of the electrons emitted by the photocathode of the 2nd+-generation IC and then interacting with the end surface of the MCP is presented. The developed model is used to study the behavior of the electrons reflected by the input surface of the MCP.