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A Microscopic Analysis of the Carrier–Velocity Distribution and the Noise in FET Devices
A Microscopic Analysis of the Carrier–Velocity Distribution and the Noise in FET Devices
1997
P. Houlet
H. Ueno
C. Hamaguchi
J. C. Vaissiere
J.P. Nougier
L. Varani
Keywords:
Condensed matter physics
Monte Carlo method
Physics
carrier velocity
Correction
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