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Commercial application of material-specific baggage screening using x-ray diffraction techniques (Conference Presentation)
Commercial application of material-specific baggage screening using x-ray diffraction techniques (Conference Presentation)
2019
Jens-Peter Schlomka
Holger Fleckenstein
Dirk Kosciesza
Joerg Meyer
Keywords:
X-ray crystallography
Materials science
Optics
Correction
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