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Studying Ambipolar Tellurene Field Effect Transistors using Microwave Near-Field Microscopy
Studying Ambipolar Tellurene Field Effect Transistors using Microwave Near-Field Microscopy
2019
Samuel Berweger
Gang Qiu
Yixiu Wang
Benjamin Pollard
Kristen Genter
Robert Tyrrell-Ead
Thomas M. Wallis
Wenzhuo Wu
Peide D. Ye
Pavel Kabos
Keywords:
Near-field scanning optical microscope
Field-effect transistor
Optoelectronics
Ambipolar diffusion
Microwave
Materials science
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