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Secondary ion mass spectrometry characterization of deuterated GaAsN films on GaAs
Secondary ion mass spectrometry characterization of deuterated GaAsN films on GaAs
2009
Damiano Giubertoni
Erica Iacob
Massimo Bersani
M. Anderle
Rinaldo Trotta
Antonio Polimeni
Mario Capizzi
Faustino Martelli
Silvia Rubini
Keywords:
Deuterium
Materials science
Secondary ion mass spectrometry
characterization
Analytical chemistry
Correction
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