Research on reliability assessment of metalized film capacitors based on T performance degradation test

Metalized film capacitor is a kind of product with a long lifetime and high reliability, so it is difficult to assess its lifetime and reliability using the traditional statistical inference based on the large sample of data from the lifetime test. Therefore, first, this paper presents a type of test called T performance degradation test, which is divided into several stages. During the test, the number of capacitors which are still under working conditions decreases stage by stage until the test lasts a long time with very fewer capacitors. Finally, this paper presents a reliability assessment method based on the data from the test. At last, an application on the reliability assessment of the energy system of the laser facility is presented.