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Capability of SiC MOSFETs under Short-Circuit Tests and Development of a Thermal Model by Finite Element Analysis
Capability of SiC MOSFETs under Short-Circuit Tests and Development of a Thermal Model by Finite Element Analysis
2019
Daniela Cavallaro
M. Pulvirenti
Edoardo Zanetti
Mario Giuseppe Saggio
Keywords:
Composite material
Materials science
Finite element method
Thermal
Short circuit
thermal model
Correction
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