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Co-Analysis for SI/PI Problems of Differential Line in Multi-Layer PCB
Co-Analysis for SI/PI Problems of Differential Line in Multi-Layer PCB
2015
Kawamitsu Yuki
Kami Yoshio
Murano Kimitoshi
Xiao Fengchao
Keywords:
Optoelectronics
Pi
Power integrity
Transmission line
Signal integrity
Materials science
Topology
concurrent analysis
multi layer
differential line
Correction
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