Transmission Electron Microscopy of Multimetallic Nanoparticles

Abstract Transmission Electron Microscopy (TEM) is one of the most powerful tools for materials classification. The versatility of TEM modes comprehends both quantitative and qualitative information, nowadays these techniques not only allow obtaining classical micrographs, but also performing several tests that enable in situ measurements and experiments to extract intrinsic information of the sample's properties. This chapter explores the combination of punctual in situ TEM experiments applied to nanoalloys with their corresponding synthetic methods to demonstrate the most interesting features that can be carried-out on a modern TEM. In situ TEM and electron holography have been included for the analysis of structural and physical properties of the metallic nanoparticles. The examination of particular multimetallic nanoparticle systems is not limited to structural imaging, with tomography it is feasible to correlate this information to atom migration phenomenon at the surface, allowing us to extract relevant catalytic applications.