Control of the Alumina Microstructure to Reduce Gate Leaks in Diamond MOSFETs

This work was made possible through grants from the Spanish Ministry of Economy and Competitiveness (Hi-Volt, ref: TEC2014-54357-C2-2-R; and DiamMOS, ref: TEC2017-86347-C2-1-R projects) and from the European H2020 Program (Green Diamond, ref: SEP-210184415, project).