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Testing the efficiency of the Si3N4 membrances for charged particles registration
Testing the efficiency of the Si3N4 membrances for charged particles registration
2003
Wojciech Polak
J. Lekki
Joanna Grybos
R. Hajduk
M. Cholewa
Oleg Kukharenko
Z. Stachura
Keywords:
Atomic physics
Chemistry
Secondary electrons
Membrane
Charged particle
Correction
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