Old Web
English
Sign In
Acemap
>
Paper
>
Interface Properties of TiN(x)/n-Si Schottky Contacts Investigated by Low Frequency Noise Measurements
Interface Properties of TiN(x)/n-Si Schottky Contacts Investigated by Low Frequency Noise Measurements
1998
Dimitriadis
Kamarinos
Logothetidis
Farmakis
Brini
Mathieu
Keywords:
Tin
Interface (computing)
Infrasound
Noise measurement
Optoelectronics
Materials science
Schottky diode
Correction
Source
Cite
Save
Machine Reading By IdeaReader
0
References
0
Citations
NaN
KQI
[]